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Inspection of integrated circuits
(1) Resistance method: By measuring the forward and reverse resistance of each pin of the integrated circuit to the ground, and comparing with the integrated circuit with good device, a judgment can be made. If the peripheral components are not damaged, the integrated circuit may be damaged. (2) Voltage method: measure the dynamic and static voltages of the pins of the integrated circuit to the ground, and compare them with the reference voltage provided. If the pin voltage is quite different and the peripheral components are not damaged, the integrated circuit may be damaged. (3) Waveform method: Use an oscilloscope to measure whether the waveform of each pin of the integrated circuit is consistent with the original design. If there is a big difference, the integrated circuit may be damaged. ¢È Replacement method: replace the test with the same type of integrated circuit. If the circuit returns to normal, the integrated circuit is damaged. |
